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Partner 8

SIEMENS AG (SIEMENS), Erlangen, Deutschland

Dr. Manfred Ruehrig
e: manfred.ruehrig@siemens.com


 

BIBLIOGRAPHY

 

Dr MANFRED RUEHRIG

Angular dependence of exchange bias in Mn80Ir20/Co60Fe20B20 bilayers.
Yang, J., Cardoso, S., Freitas, P. P., Devolder, T., Ruehrig, M., Journal of Applied Physics (IF: 2.168), 109, an: 07D704 (2011)

Stability studies of exchange bias field of Mn80Ir20/Co60Fe20B20 by network analyzer ferromagnetic resonance.
Yang, J., Cardoso, S., Freitas, P. P., Devolder, T., Ruehrig, M., Applied Physics Letters (IF: 3.841), 97, an: 132502 (2010)

Layer and interface structural changes in Co(0.6)Fe(0.2)B(0.2)/AlO(x) multilayers on annealing.
Pym, A. T. G., Ruehrig, M., Tanner, B. K., Journal of Applied Physics (IF: 2.079), 107, an: 093524 (2010)

Dynamics of the exchange field supplied by MnIr layers studied by network analyzer ferromagnetic resonance.
Bilzer, C., Devolder, T., Kim, J.V., Chappert, C., Ruehrig, M., Baer, L., Journal of Applied Physics (IF: 2.072), 106, an: 063918 (2009)

Pressure sensor based on magnetic tunnel junctions.
Meyners, D., von Hofe, T., Vieth, M., Ruehrig, M., Schmitt, S., Quandt, E., Journal of Applied Physics (IF: 2.072), 105, an: 07C914 (2009)

Characterization of embedded MgO/ferromagnet contacts for spin injection in silicon
Uhrmann, T., Dimopoulos, T., Brueckl, H., Lazarov, V. K., Kohn, A., Paschen, U., Weyers, S., Baer, L., Ruehrig, M., Journal of Applied Physics (IF: 2.201), 103, an: 063709 (2008)

 

 

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